کتاب های Alain Diebold
Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)
David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, W. Murray Bullis, Patrick J. Smith, Erik M. Secula, 2001
Handbook of Silicon Semiconductor Metrology
Alain C. Diebold (Editor), 2001
Handbook of Sensor Networks: Compact Wireless and Wired Sensing Systems
Alain C. Diebold, 2004
