کتاب های Bee International
Selected Systems from Al-Fe-V to Al-Ni-Zr (Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology - New Series Physical Chemistry)
MSIT Materials Science International Team, 2005
Ergonomic Checkpoints: Practical and Easy-to-Implement Solutions for Improving Safety, Health and Working Conditions
International Labour Organisation, 2010
Delphi for Windows
Borland International, 1995
Diagnostic Simulated GAMSAT
MedPrep International, 2009
Food Contact Legislation for US Markets
Pira International Ltd, 2012-02-21
Neutron reflectometry : a probe for materials surfaces : proceedings of a technical meeting
International Atomic Energy Agency, 2006
Recycling of plutonium and uranium in water reactor fuel : proceedings of a Technical Committee meeting held in Newby Bridge, Windermere, United Kingdom, 3-7 July 1995
International Atomic Energy Agency. Technical Committee on Recycling of Plutonium, 1997
Safety related design and economic aspects of HTGRs : Proceedings of a technical committee meeting held in Beijing, China, 24 November 1998
International Atomic Energy Agency, 2001
Thermohydraulic relationships for advanced water cooled reactors
International Atomic Energy Agency, 2001
Unusual occurrences during LMFR operation
International Atomic Energy Agency, 2000
ABC of Women Workers Rights’ and Gender Equality
International Labour Office, 2008
ICC Model Mergers & Acquisitions Contract
International Chamber of Commerce, 2004
Enhancing global competitiveness through sustainable environmental stewardship
Subhash C Jain; Ben L Kedia; University of Connecticut. Center for International Business Education, 2011
Standards for the Assessment of Reading and Writing (revised edition)
International Reading Association, 2009
ISTFA 2006 : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA
International Symposium for Testing, 2006
ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California
Electronic Device Failure Analysis Society.; International Symposium for Testing, 2011
