نتایج جستجو
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Metrology in Industry - The Key for Quality
French College of Metrology, Dominique Placko, 2006![Metrology in Industry: The Key for Quality](http://cdn.ketabkoo.com/covers/1/153582-n.jpg)
Metrology in Industry: The Key for Quality
French College of Metrology(auth.), 2006![Optical Metrology: Coherent and Incoherent Optics for Metrology, Sensing and Control in Science, Industry and Biomedicine](http://cdn.ketabkoo.com/covers/1/153594-n.jpg)
Optical Metrology: Coherent and Incoherent Optics for Metrology, Sensing and Control in Science, Industry and Biomedicine
H. J. Caulfield (auth.), Olivério D. D. Soares (eds.), 1987![Transverse Disciplines in Metrology](http://cdn.ketabkoo.com/covers/1/153617-n.jpg)
Transverse Disciplines in Metrology
French College of Metrology, 2009![Transverse Disciplines in Metrology](http://cdn.ketabkoo.com/covers/1/153618-n.jpg)
Transverse Disciplines in Metrology
French College of Metrology(auth.), 2009![Advanced Mathematical And Computational Tools in Metrology VII (Series on Advances in Mathematics for Applied Sciences)](http://cdn.ketabkoo.com/covers/0/50027-n.jpg)
Advanced Mathematical And Computational Tools in Metrology VII (Series on Advances in Mathematics for Applied Sciences)
P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert, 2006![Advances in Data Modeling for Measurements in the Metrology and Testing Fields](http://cdn.ketabkoo.com/covers/0/63051-n.jpg)
Advances in Data Modeling for Measurements in the Metrology and Testing Fields
Franco Pavese, Alistair B.Forbes, 2004![Handbook of optical metrology: principles and applications](http://cdn.ketabkoo.com/covers/0/80958-n.jpg)
Handbook of optical metrology: principles and applications
Toru Yoshizawa (editor), 2009![Handbook of optical metrology: principles and applications](http://cdn.ketabkoo.com/covers/0/80959-n.jpg)
Handbook of optical metrology: principles and applications
Toru Yoshizawa (editor), 2009![Handbook of optical metrology: principles and applications](http://cdn.ketabkoo.com/covers/0/80960-n.jpg)
Handbook of optical metrology: principles and applications
Toru Yoshizawa (editor), 2009![Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)](http://cdn.ketabkoo.com/covers/1/145073-n.jpg)
Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)
David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, W. Murray Bullis, Patrick J. Smith, Erik M. Secula, 2001![Advanced Mathematical And Computational Tools in Metrology (Series on Advances in Mathematics for Applied Sciences)](http://cdn.ketabkoo.com/covers/1/145648-n.jpg)
Advanced Mathematical And Computational Tools in Metrology (Series on Advances in Mathematics for Applied Sciences)
P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert, 2006![Advanced Mathematical and Computational Tools in Metrology VII: 7](http://cdn.ketabkoo.com/covers/1/145649-n.jpg)
Advanced Mathematical and Computational Tools in Metrology VII: 7
P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert, 2006![Mass Metrology](http://cdn.ketabkoo.com/covers/1/153455-n.jpg)
Mass Metrology
S. V. Gupta (auth.), 2012![A Practical Guide to Optical Metrology for Thin Films](http://cdn.ketabkoo.com/covers/1/153525-n.jpg)
A Practical Guide to Optical Metrology for Thin Films
Dr. Michael Quinten(auth.), 2012![Accurate Visual Metrology from Single and Multiple Uncalibrated Images](http://cdn.ketabkoo.com/covers/1/153526-n.jpg)
Accurate Visual Metrology from Single and Multiple Uncalibrated Images
Antonio Criminisi (auth.), 2001![Advanced Holography - Metrology and Imaging](http://cdn.ketabkoo.com/covers/1/153527-n.jpg)
Advanced Holography - Metrology and Imaging
I. Naydenova, 2011![Advanced Mathematical & Computational Tools in Metrology IV](http://cdn.ketabkoo.com/covers/1/153528-n.jpg)
Advanced Mathematical & Computational Tools in Metrology IV
Ciarlini P., et al. (eds.), 2000![Advanced mathematical and computational tools in metrology and testing X](http://cdn.ketabkoo.com/covers/1/153529-n.jpg)
Advanced mathematical and computational tools in metrology and testing X
Pavese, Franco et al. (eds.), 2015![Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII](http://cdn.ketabkoo.com/covers/1/153530-n.jpg)
Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
Franco Pavese; World Scientific (Firm); et al(eds.), 2009![Advanced Mathematical and Computational Tools in Metrology V](http://cdn.ketabkoo.com/covers/1/153531-n.jpg)
Advanced Mathematical and Computational Tools in Metrology V
P. Ciarlini, M. G. Cox, E. Filipe, F. Pavese, D. Richter, 2001![Advanced Mathematical and Computational Tools in Metrology VI](http://cdn.ketabkoo.com/covers/1/153532-n.jpg)