انتشارات Exit International
ISTFA 2006 : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA
International Symposium for Testing, 2006
ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California
Electronic Device Failure Analysis Society.; International Symposium for Testing, 2011
Applications in Electronics Pervading Industry, Environment and Society
Alessandro De Gloria (eds.), 2014
Applications in Electronics Pervading Industry, Environment and Society: APPLEPIES 2014
Alessandro De Gloria (eds.), 2016
Semantics and Psychology of Spirituality: A Cross-Cultural Analysis
Heinz Streib, 2016
Geometric Control Theory and Sub-Riemannian Geometry
Gianna Stefani, 2014
Geometric Control Theory and Sub-Riemannian Geometry
Gianna Stefani, 2014
Manipulation of Multiphase Materials for Touch-less Nanobiotechnology: A Pyrofluidic Platform
Sara Coppola (auth.), 2016
Towards the Future of Fuzzy Logic
Rudolf Seising, 2015
Flexible and Stretchable Electronic Composites
Deepalekshmi Ponnamma, 2016
Educational Media and Technology Yearbook: Volume 38
Michael Orey, 2014
