نتایج جستجو
برای Metrology، صفحه ۲ از ۷ در بین ۱۵۳ کتاب.
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Advanced Mathematical Tools in Metrology III
P. Ciarlini, M. G. Cox, F. Pavese, D. Richter, 1997
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Advances in Speckle Metrology and Related Techniques
Guillermo H. Kaufmann (ed.), 2011PDF
Applied Metrology for Manufacturing Engineering
Ammar Grous(auth.), 2011PDF
Basic Metrology for Iso 9000 Certification
G. M. S. de Silva, 2002PDF
Computational Surface and Roundness Metrology
Bala Muralikrishnan, Jay Raja (auth.), 2009PDF
Coordinate Metrology : Accuracy of Systems and Measurements
Jerzy A. Sładek (auth.), 2016PDF
Data modeling for metrology and testing in measurement science
Franco Pavese (auth.), Franco Pavese, Alistair B. Forbes (eds.), 2009PDF
Data Modeling for Metrology and Testing in Measurement Science
Franco Pavese (auth.), Franco Pavese, Alistair B. Forbes (eds.), 2009PDF
Data Modeling for Metrology and Testing in Measurement Science
Franco Pavese (auth.), Franco Pavese, Alistair B. Forbes (eds.), 2009PDF
Distributed Large-Scale Dimensional Metrology: New Insights
Fiorenzo Franceschini, Maurizio Galetto, Domenico Maisano, Luca Mastrogiacomo, Barbara Pralio (auth.), 2011DJVU
Engineering Metrology
Hume, K. J.PDF
Engineering metrology and measurements
Krishnamurthy, L.; Raghavendra, N. V, 2013PDF
Forensic Metrology: Scientific Measurement and Inference for Lawyers, Judges and Criminalists
Ted Vosk; AF Emery, 2014
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Frequency Standards and Metrology: Proceedings of the Fourth Symposium, Ancona, Italy, September 5 – 9, 1988
N. F. Ramsey (auth.), Professor Dr. Andrea De Marchi (eds.), 1989PDF
Fringe 2009: 6th International Workshop on Advanced Optical Metrology
Charles M. (auth.), Wolfgang Osten, Malgorzata Kujawinska (eds.), 2009PDF
Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology
Joseph W. Goodman (auth.), Wolfgang Osten (eds.), 2014PDF
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
Manuel Servin, J. Antonio Quiroga, Moises Padilla, July 2014PDF
Graphene nanoelectronics : metrology, synthesis, properties and applications
Hassan Raza (ed.), 2012PDF
Graphene Nanoelectronics: Metrology, Synthesis, Properties and Applications
Hassan Raza (auth.), Hassan Raza (eds.), 2012PDF
Gravitational Measurements, Fundamental Metrology and Constants
A. O. Barut (auth.), Venzo De Sabbata, V. N. Melnikov (eds.), 1988
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