نتایج جستجو
CliffsNotes GRE General Test Cram Plan 2nd Edition
Jane R. Burstein, Catherine McMenamin, Carolyn Wheater, 2011
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel (auth.), 2010
Piping Examination and Leak Test Guide
Process Industry Practices
A Collection of Test Problems for Constrained Global Optimization Algorithms
Christodoulos A. Floudas, Panos M. Pardalos (auth.), 1990
Electrical Test Equipment for Use by Electricians (Guidance Notes 38)
Health and Safety Executive (HSE), 2004
Analog signal generation for built-in-self-test of mixed-signal integrated circuits
Roberts, Gordon W, 1995
Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration
Amir Zjajo, José Pineda de Gyvez (auth.), 2011
VLSI Test Principles and Architectures: Design for Testability
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, 2006
VLSI Test Principles and Architectures: Design for Testability
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, 2006
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, 2006
Design for AT-Speed Test, Diagnosis and Measurement (FRONTIERS IN ELECTRONIC TESTING Volume 15)
Benoit Nadeau-Dostie, 1999
Test and Evaluation of Aircraft Avionics and Weapons Systems
Robert E. McShea, 2010
Emerging Nanotechnologies -Test Defect Tolerance and Reliability -SP
written by Katarzyna Radecka, Zeljko Zilic., 2008
IEEE Std 829-2008 IEEE Standard for Software and System Test Documentation
IEEE Computer Society
Cost-Benefit Analysis of the 2006 Air Force Materiel Command Test and Evaluation Proposal
Michael R. Thirtle, 2008
Helicopter Test And Evaluationgnt
Cooke A.K., Fitzpatrick E., 2002
Digital System Test and Testable Design: Using HDL Models and Architectures
Zainalabedin Navabi (auth.), 2011
