نتایج جستجو
Boundary-Scan Interconnect Diagnosis (Frontiers in Electronic Testing)
JosA© T. de Sousa, Peter Y.K. Cheung, 2001
Broken Genius: The Rise and Fall of William Shockley, Creator of the Electronic Age
Joel N. Shurkin, 2006
Chemistry Resources in the Electronic Age
Judith Bazler, 2003
Circuits for electronic instrumentation
TH O'Dell, 1991
coating materials for electronic applications polymers processes reliability testing
James J. Licari, 2004
Concepts in highly excited electronic systems
Sadamichi Maekawa, 2003
Concepts of Highly Excited Electronic Systems
Jamal Berakdar, 2003
Conical intersections: electronic structure, dynamics & spectroscopy
Wolfgang Domcke, David R. Yarkony, Horst Koppel, 2004
Contamination Effects on Electronic Products
Tautscher, 1991
Contamination of Electronic Assemblies
Elissa M. Bumiller, David A. Douthit, Joan Pecht, 2002
Coupling of Electronic and Nuclear Motions in Diatomic Molecules
Condon E. U., 1927
CVD diamond for electronic devices and sensors
Ricardo S. Sussmann, 2009
Cyber Cities: Visual Perception in the Age of Electronic Communication
M.Christine Boyer, 1996
Cybercash: The Coming Era of Electronic Money
Guttmann R., 2003
Cybercash: The Coming Era of Electronic Money
Robert Guttmann, 2002
Dahnert’s Electronic Radiology Review
Wolfgang Dahnert
Debugging at the Electronic System Level
Frank Rogin, Rolf Drechsler (auth.), 2010
Deja Vu: Aberrations Of Cultural Memory (Electronic Mediations)
Peter Krapp, 2004
Delton T. Horn's All-Time Favorite Electronic Projects
Delton T. Horn, 1988
Design Automation of Real-Life Asynchronous Devices and Systems (Foundations and Trends(R) in Electronic Design Automation)
Alexander Taubin, Jordi Cortadella, Luciano Lavagno, 2007
Design for AT-Speed Test, Diagnosis and Measurement (FRONTIERS IN ELECTRONIC TESTING Volume 15)
Benoit Nadeau-Dostie, 1999
