نتایج جستجو
Cambridge practice test for IELTS 1
Vanessa Jakeman, Clare McDowell, 1997
Cambridge practice test for IELTS 1
Jakeman V., McDowell C., 1996
Cambridge practice test for IELTS 3
Jakeman V., McDowell C., 2002
IELTS Practice Now: Practice in Listening, Reading, Writing and Speaking for the IELTS Test
Carol Gibson, etc., Midon Nakamura, Peter Forward, 1996
Listening strategies for the IELTS test
LI YA BIN BIAN ZHU, 1991
.NET Test Automation Recipes: A Problem-Solution Approach
Dr. James McCaffrey, 2006
.NET Test Automation Recipes: A Problem-Solution Approach
James D. McCaffrey (auth.), 2006
.NET Test Automation Recipes: A Problem-Solution Approach
James McCaffrey, 2012
A Top-Down Approach to Risk Management and Internal Control-Issue #4: Relying on Ongoing Monitoring to Test Controls Performance, to Reduce the Scope of Separate Testing
Financial Executives Research Foundation; Inc., 2007
A+ Training & Test Preparation Guide, Volume II – 6th Edition
Garrett Smiley, Richard Harrison, 2003
CliffsNotes GRE General Test Cram Plan
Carolyn Wheater, Catherine McMenamin, Jane R. Burstein, 2011
CliffsNotes GRE General Test Cram Plan 2nd Edition
Jane R. Burstein, Catherine McMenamin, Carolyn Wheater, 2011
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel (auth.), 2010
Piping Examination and Leak Test Guide
Process Industry Practices
A Collection of Test Problems for Constrained Global Optimization Algorithms
Christodoulos A. Floudas, Panos M. Pardalos (auth.), 1990
Electrical Test Equipment for Use by Electricians (Guidance Notes 38)
Health and Safety Executive (HSE), 2004
Analog signal generation for built-in-self-test of mixed-signal integrated circuits
Roberts, Gordon W, 1995
Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration
Amir Zjajo, José Pineda de Gyvez (auth.), 2011
VLSI Test Principles and Architectures: Design for Testability
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, 2006
VLSI Test Principles and Architectures: Design for Testability
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, 2006
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, 2006
Design for AT-Speed Test, Diagnosis and Measurement (FRONTIERS IN ELECTRONIC TESTING Volume 15)
Benoit Nadeau-Dostie, 1999
