دانلود کتاب Reliability of multiphysical systems set. Volume 2, Nanometer-scale defect detection using polarized light

Name: Reliability of multiphysical systems set. Volume 2, Nanometer-scale defect detection using polarized light
Availability: InStock
Author: Dahoo, Pierre Richard
ISBN: 1848219369,9781848219366,9781119329657,1119329

by Dahoo, Pierre Richard, El Hami, Abdelkhalak, Pougnet, Philippe

عنوان فارسی: قابلیت اطمینان سیستم های multiphysical تنظیم شده است. دوره 2، در حد بیلیونیوم متر تشخیص نقص با استفاده از نور پلاریزه
ناشر: Wiley-ISTE
سال: 2016
ویرایش: 1
زبان: انگلیسی
تعداد صفحه (نسخه چاپی - نسخه الکترونیکی): 320-317
شابک: 1848219369,9781848219366,9781119329657,1119329
نوع فایل: PDF دانلود نرم افزار مطالعه
حجم: 10.08 مگابایت

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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.