دانلود کتاب Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization

Name: Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
Availability: InStock
Author: Nicolas Brodusch
ISBN: 9789811044328, 9789811044335

by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin (auth.)

عنوان فارسی: میکروسکوپ الکترونی اسکن خروجی میدان: دیدگاه های جدید برای مشخص کردن مواد
ناشر: Springer Singapore
سال: 2018
ویرایش: 1
زبان: انگلیسی
تعداد صفحه (نسخه چاپی - نسخه الکترونیکی): XII, 137-1
شابک: 9789811044328, 9789811044335
نوع فایل: PDF دانلود نرم افزار مطالعه
حجم: 7.06 مگابایت

گزارش تخلف

دانلود کتاب

افزودن خلاصه فارسی

جزییات کتاب

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage