جزییات کتاب
This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra. Content: Chapter 1 Introduction (pages 1–19): Brent FultzChapter 2 Experimental Techniques and Instrumentation (pages 21–47): Ray F. EgertonChapter 3 EELS Quantitative Analysis (pages 49–96): Richard LeapmanChapter 4 Energy Loss Fine Structure (pages 97–126): Peter RezChapter 5 Energy Filtered Diffraction (pages 127–158): Ludwig ReimerChapter 6 Elemental Mapping Using Energy Filtered Imaging (pages 159–222): Ferdinand Hofer and Peter WarbichlerChapter 7 Probing Materials Chemistry Using ELNES (pages 223–270): Richard Morgan Drummond?Brydson, Hermann Sauer and Wilfried EngelChapter 8 Application of EELS to Ceramics, Catalysts and Transition Metal Oxides (pages 271–316): J. Bentley and J. GraetzChapter 9 EELS Analysis of the Electronic Structure and Microstructure of Metals (pages 317–352): J. K. Okamoto, D. H. Pearson, A. Hightower, C. C. Ahn and B. FultzChapter 10 Electron Energy Loss Studies in Semiconductors (pages 353–384): Philip E. BatsonChapter 11 Electron Energy Loss Spectroscopy of Magnetic Materials (pages 385–418): Jennifer A. DooleyChapter 12 Electron Energy Loss Spectroscopy of Polymers (pages 419–454): Matthew R. Libera and Mark M. Disko