دانلود کتاب Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

Name: Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices
Availability: InStock
Author: Paul van der Heide
ISBN: 1118480481,9781118480489

by Paul van der Heide

عنوان فارسی: طیف سنجی جرمی یون ثانویه: مقدمه ای بر اصول و شیوه ها
ناشر: Wiley
سال: 2014
ویرایش: 1
زبان: انگلیسی
تعداد صفحه (نسخه چاپی - نسخه الکترونیکی): 384-386
شابک: 1118480481,9781118480489
نوع فایل: PDF دانلود نرم افزار مطالعه
حجم: 3.68 مگابایت

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جزییات کتاب

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)• Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations• Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission• Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)• Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions• Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

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