دانلود کتاب Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Second Edition

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)Content: Chapter 1 Introduction (pages 1–5): John C. Riviere and Dr. Henning BubertChapter 2 X?Ray Photoelectron Spectroscopy (XPS) (pages 7–41): Dr. Henning Bubert, John C. Riviere and Wolfgang S. M. WernerChapter 3 Auger Electron Spectroscopy (AES) (pages 43–65): Dr. Henning Bubert, John C. Riviere and Wolfgang S. M. WernerChapter 4 Electron Energy?Loss Spectroscopy (EELS) and Energy?Filtering Transmission Electron Microscopy (EFTEM) (pages 67–91): Reinhard SchneiderChapter 5 Low?Energy Electron Diffraction (LEED) (pages 93–109): Georg HeldChapter 6 Other Electron?Detecting Techniques (pages 111–113): John C. RiviereChapter 7 Static Secondary Ion Mass Spectrometry (SSIMS) (pages 115–139): Heinrich F. ArlinghausChapter 8 Dynamic Secondary Ion Mass Spectrometry (SIMS) (pages 141–159): Herbert HutterChapter 9 Electron?Impact (EI) Secondary Neutral Mass Spectrometry (SNMS) (pages 161–177): Michael Kopnarski and Holger JenettChapter 10 Laser Secondary Neutral Mass Spectrometry (Laser?SNMS) (pages 179–189): Heinrich F. ArlinghausChapter 11 Rutherford Backscattering Spectroscopy (RBS) (pages 191–202): Leopold PalmetshoferChapter 12 Low?Energy Ion Scattering (LEIS) (pages 203–215): Peter BauerChapter 13 Elastic Recoil Detection Analysis (ERDA) (pages 217–227): Oswald BenkaChapter 14 Nuclear Reaction Analysis (NRA) (pages 229–236): Oswald BenkaChapter 15 Field Ion Microscopy (FIM) and Atom Probe (AP) (pages 237–260): Yuri Suchorski and Wolfgang DrachselChapter 16 Other Ion?Detecting Techniques (pages 261–264): John C. RiviereChapter 17 Total?Reflection X?Ray Fluorescence (TXRF) Analysis (pages 265–292): Laszlo Fabry, Siegfried Pahlke and Burkhard BeckhoffChapter 18 Energy?Dispersive X?Ray Spectroscopy (EDXS) (pages 293–310): Reinhard SchneiderChapter 19 Grazing Incidence X?Ray Methods for Near?Surface Structural Studies (pages 311–327): P. Neil GibsonChapter 20 Glow Discharge Optical Emission Spectroscopy (GD?OES) (pages 329–344): Volker Hoffmann and Alfred QuentmeierChapter 21 Surface Analysis by Laser Ablation (pages 345–355): Roland Hergenroder and Michail BolshovChapter 22 Ion Beam Spectrochemical Analysis (IBSCA) (pages 357–366): Volker RupertusChapter 23 Reflection Absorption IR Spectroscopy (RAIRS) (pages 367–375): Karsten HinrichsChapter 24 Surface Raman Spectroscopy (pages 377–391): Wieland Hill and Bernhard LendlChapter 25 UV?VIS?IR Ellipsometry (ELL) (pages 393–405): Bernd Gruska and Karsten HinrichsChapter 26 Sum Frequency Generation (SFG) Spectroscopy (pages 407–435): Gunther Rupprechter and Athula BandaraChapter 27 Other Photon?Detecting Techniques (pages 437–438): John C. RiviereChapter 28 Introduction (pages 439–442): Prof. Dr. Gernot FriedbacherChapter 29 Atomic Force Microscopy (AFM) (pages 443–464): Prof. Dr. Gernot FriedbacherChapter 30 Scanning Tunneling Microscopy (STM) (pages 465–480): Prof. Dr. Gernot FriedbacherChapter 31 Scanning Near?Field Optical Microscopy (SNOM) (pages 481–497): Marc Richter and Volker Deckert