جزییات کتاب
This volume—dedicated to William Q. Meeker on the occasion of his sixtieth birthday—is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics, and finance.Specific topics covered include:* Accelerated testing and inference* Step-stress testing and inference* Nonparametric inference* Model validity in accelerated testing* The point process approach* Bootstrap methods in degradation analysis* Exact inferential methods in reliability* Dynamic perturbed systems* Degradation models in statisticsAdvances in Degradation Modeling is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.