-
Richard J. Peterson
Click on cover to enlarge.
Buy This Book
From Amazon.
4 - 5Hours to read
دانلود کتاب Power-Constrained Testing Of Vlsi Circuits
by Richard J. Peterson|
|
عنوان فارسی: قدرت محدود تست مدارات VLSI |
دانلود کتاب
جزییات کتاب
This book focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the very large scale integrated (VLSI) design flow. After a survey of existing techniques for power constrained testing of VLSI circuits, several test automation techniques are presented for reducing power in scan-based sequential circuits and BIST data paths. Nicolici is affiliated with McMaster University, Canada. Al-Hashimi is affiliated with the University of Southampton, UK.
کتاب های مرتبط
این کتاب رو مطالعه کردید؟ نظر شما چیست؟
برای ارسال نظر، لطفا وارد شوید.
نظر دهید
Adding comments has been disabled.
نظرات (0)
هنوز نظری داده نشده است. شما اولین باشید!
