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Richard J. Peterson
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دانلود کتاب Power-Constrained Testing Of Vlsi Circuits
by Richard J. Peterson|
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عنوان فارسی: قدرت محدود تست مدارات VLSI |
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جزییات کتاب
This book focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the very large scale integrated (VLSI) design flow. After a survey of existing techniques for power constrained testing of VLSI circuits, several test automation techniques are presented for reducing power in scan-based sequential circuits and BIST data paths. Nicolici is affiliated with McMaster University, Canada. Al-Hashimi is affiliated with the University of Southampton, UK.
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