دانلود کتاب Failure Analysis of Integrated Circuits: Tools and Techniques

Name: Failure Analysis of Integrated Circuits: Tools and Techniques
Availability: InStock
Author: Lawrence C. Wagner (auth.)
ISBN: 9781461372318, 9781461549192

by Lawrence C. Wagner (auth.)

عنوان فارسی: تجزیه و تحلیل شکست از مدارهای مجتمع ابزارها و فنون
ناشر: Springer US
سال: 1999
ویرایش: 1
زبان: انگلیسی
تعداد صفحه (نسخه چاپی - نسخه الکترونیکی): 255-255
شابک: 9781461372318, 9781461549192
نوع فایل: PDF دانلود نرم افزار مطالعه
حجم: 21.00 مگابایت

گزارش تخلف

دانلود کتاب

افزودن خلاصه فارسی

جزییات کتاب

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.

کتاب های مرتبط

این کتاب رو مطالعه کردید؟ نظر شما چیست؟

برای ارسال نظر، لطفا وارد شوید.

نظر دهید

Adding comments has been disabled.

نظرات (0)

هنوز نظری داده نشده است. شما اولین باشید!