دانلود کتاب Lattice statistics and mathematical physics : proceedings of the APCTP-NANKAI Joint Symposium : festschrift dedicated to Professor Fa-Yueh Wu on the occasion of his 70th birthday : Tianjin, China, 7-11 October, 2001

he main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons Happer's Curious Degeneracies and Yangian (C-M Bai et al.); The Rotor Model and Combinatorics (M T Batchelor et al.); Mutually Local Fields from Form Factors (A Fring); Dimers and Spanning Trees: Some Recent Results (F Y Wu); Exotic Galilean Symmetry and the Hall Effect (C Duval & P A Horvathy); The Three-State Chiral Clock Model (B-Q Jin et al.); Quantum Dynamics and Random Matrix Theory (H Kunz); Short-Time Behaviors of Long-Ranged Interactions (H Fang et al.); Comments on the Deformed WN Algebra (S Odake); New Results for Susceptibilities in Planar Ising Models (H Au-Yang & J H H Perk); Limitations on Quantum Control (A I Solomon & S G Schirmer); R-Matrices and the Tensor Product Graph Method (M D Gould & Y-Z Zhang); and other papers