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Otwin Breitenstein
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دانلود کتاب Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
by Otwin Breitenstein|
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عنوان فارسی: قفل در ترموگرافی: مبانی و استفاده برای ارزیابی دستگاه های الکترونیکی و مواد |
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جزییات کتاب
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
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