دانلود کتاب ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California

Name: ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California
Availability: InStock
Author: Electronic Device Failure Analysis Society.
ISBN: 9781615038268, 9781615038503, 1615038507, 1615

by Electronic Device Failure Analysis Society., International Symposium for Testing

عنوان فارسی: ISTFA 2011 : کنفرانس از سمپوزیوم بین المللی 37 آزمون و تجزیه و تحلیل شکست ، نوامبر 13-17، 2011 ، مرکز کنوانسیون سان خوزه، سن خوزه، کالیفرنیا
ناشر: ASM International
سال: 2011
زبان: انگلیسی
تعداد صفحه (نسخه چاپی - نسخه الکترونیکی): xix, 456 p
شابک: 9781615038268, 9781615038503, 1615038507, 1615
نوع فایل: PDF دانلود نرم افزار مطالعه
حجم: 48.00 مگابایت

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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results