دانلود کتاب Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Todays electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits.The outcome of testing is product quality, which means `meeting the users needs at a minimum cost. The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.The book consists of:Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault ModelingPart II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ TestPart III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future TestingAppendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing Bibliography: over 700 entries.