دانلود کتاب Reliability and Radiation Effects in Compound Semiconductors

Name: Reliability and Radiation Effects in Compound Semiconductors
Availability: InStock
Author: Johnston
ISBN: 9781615836871, 9789814277105

by Johnston

عنوان فارسی: قابلیت اطمینان و اثرات تابش در ترکیب نیمه رساناها
ناشر: World Scientific
سال: 2010
زبان: انگلیسی
تعداد صفحه (نسخه چاپی - نسخه الکترونیکی): 375[378]
شابک: 9781615836871, 9789814277105
نوع فایل: PDF دانلود نرم افزار مطالعه
حجم: 4.00 مگابایت

گزارش تخلف

دانلود کتاب

افزودن خلاصه فارسی

جزییات کتاب

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. First, it starts with principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for 10 years or more with low failure rates.

کتاب های مرتبط

این کتاب رو مطالعه کردید؟ نظر شما چیست؟

برای ارسال نظر، لطفا وارد شوید.

نظر دهید

Adding comments has been disabled.

نظرات (0)

هنوز نظری داده نشده است. شما اولین باشید!