نتایج جستجو

Pattern Recognition. ICPR International Workshops and Challenges: Virtual Event, January 10–15, 2021, Proceedings, Part III (Image Processing, Computer Vision, Pattern Recognition, and Graphics)
Alberto Del Bimbo (editor), Rita Cucchiara (editor), Stan Sclaroff (editor), Giovanni Maria Farinella (editor), Tao Mei (editor), Marco Bertini (editor), Hugo Jair Escalante (editor), Roberto Vezzani (editor), 2021
Pattern Recognition. ICPR International Workshops and Challenges: Virtual Event, January 10-15, 2021, Proceedings, Part VII (Image Processing, Computer Vision, Pattern Recognition, and Graphics)
Alberto Del Bimbo (editor), Rita Cucchiara (editor), Stan Sclaroff (editor), Giovanni Maria Farinella (editor), Tao Mei (editor), Marco Bertini (editor), Hugo Jair Escalante (editor), Roberto Vezzani (editor), 2021
Image Analysis and Processing – ICIAP 2022: 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part II (Lecture Notes in Computer Science, 13232)
Stan Sclaroff (editor), Cosimo Distante (editor), Marco Leo (editor), Giovanni M. Farinella (editor), Federico Tombari (editor), 2022
Technical Writing for Today and Tomorrow
Stan Hunter Kranc, 2019
Bhutan
Stan Armington, 2002